This article thoroughly examines the crucial role of predictive analytics and fault tolerance mechanisms in enhancing the reliability of microelectronic devices throughout their design and manufacturing processes. Emphasizing the importance of implementing these measures across the entire lifecycle, including design, manufacturing, and application phases, the study adopts a comprehensive approach. The methodology integrates predictive analytics tools and fault tolerance mechanisms, proactively identifying and mitigating potential issues early on. Results demonstrate a significant reduction in device failures, showcasing the transformative impact of these technologies. Overall, the research advocates for the strategic integration of predictive analytics and fault tolerance mechanisms to advance the reliability of microelectronic devices across diverse applications.