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Christensen, B. G.; Wilen, C. D.; Opremcak, A.; Nelson, J.; Schlenker, F.; Zimonick, C. H.; Faoro, L.; Ioffe, L. B.; Rosen, Y. J.; DuBois, J. L.; Plourde, B. L. T.; McDermott, R.
Physical review. B, 10/2019, Letnik: 100, Številka: 14Journal Article
We have used Ramsey tomography to characterize charge noise in a weakly charge-sensitive superconducting qubit. We find a charge noise that scales with frequency as 1/fα over five decades with α=1.93 and a magnitude Sq(1Hz)=2.9×10−4e2/Hz. The noise exponent and magnitude of the low-frequency noise are much larger than those seen in prior work on single electron transistors, yet are consistent with reports of frequency noise in other superconducting qubits. Moreover, we observe frequent large-amplitude jumps in offset charge exceeding 0.1e; these large discrete charge jumps are incompatible with a picture of localized dipolelike two-level fluctuators. The data reveal an unexpected dependence of charge noise on device scale and suggest models involving either charge drift or fluctuating patch potentials.
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in: SICRIS
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