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Eberle, Aaron P. R; Wagner, Norman J; Akgun, Bulent; Satija, Sushil K
Langmuir, 03/2010, Letnik: 26, Številka: 5Journal Article
The phase behavior of a molecular brush-C18 grafted to the surface of both a silicon wafer and SiO2 nanoparticles was investigated as a function of temperature using neutron reflectometry (NR) and small-angle neutron scattering (SANS), respectively. The experiments demonstrate a phase change in the brush layer characterized by a straightening of the molecular configuration, increase in shell thickness, and increase in solvent concentration with decreasing temperature that corresponds to gelation in the nanoparticle dispersion.
