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Esfandiari, N. Melody; Wang, Yong; Bass, Jonathan Y; Cornell, Trevor P; Otte, Douglas A. L; Cheng, Ming H; Hemminger, John C; McIntire, Theresa M; Mandelshtam, Vladimir A; Blum, Suzanne A
Journal of the American Chemical Society, 11/2010, Letnik: 132, Številka: 43Journal Article
Single-molecule fluorescence microscopy provided information about the real-time distribution of chemical reactivity on silicon oxide supports at the solution−surface interface, at a level of detail which would be unavailable from a traditional ensemble technique or from a technique that imaged the static physical properties of the surface. Chemical reactions on the surface were found to be uncorrelated; that is, the chemical reaction of one metal complex did not influence the location of a future chemical reaction of another metal complex.
