We describe how the contribution of crystallographic texture to the anisotropy of the resistivity of polycrystalline samples can be estimated by averaging over crystallographic orientations through a geometric mean approach. The calculation takes into account the orientation distribution refined from neutron diffraction data and literature values for the single crystal resistivity tensor. The example discussed here is a melt-cast processed Bi₂Sr₂CaCu₂O (Bi-2212) polycrystalline tube in which the main texture component is a fiber texture with relatively low texture strength. Experimentally-measured resistivities along the longitudinal, radial, and tangential directions of the Bi-2212 tube were compared to calculated values and found to be of the same order of magnitude. Calculations for this example and additional simulations for various texture strengths and single crystal resistivity anisotropies confirm that in the case of highly anisotropic phases such as Bi-2212, even low texture strengths have a significant effect on the anisotropy of the resistivity in polycrystalline samples.