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Ramsdale, C.M; Bache, I.C; MacKenzie, J.D; Thomas, D.S; Arias, A.C; Donald, A.M; Friend, R.H; Greenham, N.C
Physica. E, Low-dimensional systems & nanostructures, 04/2002, Letnik: 14, Številka: 1Journal Article
We report the use of environmental scanning electron microscopy (ESEM) to determine the phase separation in the cross-section of a 200 nm thick polyfluorene blend film, of the type used in polymer photovoltaic devices and LEDs. The micron and sub-micron surface phases are found to penetrate through the film to the underlying substrate, whilst smaller surface features do not necessarily propagate through the film. The observed cross-sectional structure helps to explain the optoelectronic response of these blends and shows that ESEM is an effective tool in the characterisation of polymer blend cross-sections.
