E-viri
Recenzirano
-
Ramsdale, C.M; Bache, I.C; MacKenzie, J.D; Thomas, D.S; Arias, A.C; Donald, A.M; Friend, R.H; Greenham, N.C
Physica. E, Low-dimensional systems & nanostructures, 04/2002, Letnik: 14, Številka: 1Journal Article
We report the use of environmental scanning electron microscopy (ESEM) to determine the phase separation in the cross-section of a 200 nm thick polyfluorene blend film, of the type used in polymer photovoltaic devices and LEDs. The micron and sub-micron surface phases are found to penetrate through the film to the underlying substrate, whilst smaller surface features do not necessarily propagate through the film. The observed cross-sectional structure helps to explain the optoelectronic response of these blends and shows that ESEM is an effective tool in the characterisation of polymer blend cross-sections.
Avtor
![loading ... loading ...](themes/default/img/ajax-loading.gif)
Vnos na polico
Trajna povezava
- URL:
Faktor vpliva
Dostop do baze podatkov JCR je dovoljen samo uporabnikom iz Slovenije. Vaš trenutni IP-naslov ni na seznamu dovoljenih za dostop, zato je potrebna avtentikacija z ustreznim računom AAI.
Leto | Faktor vpliva | Izdaja | Kategorija | Razvrstitev | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Baze podatkov, v katerih je revija indeksirana
Ime baze podatkov | Področje | Leto |
---|
Povezave do osebnih bibliografij avtorjev | Povezave do podatkov o raziskovalcih v sistemu SICRIS |
---|
Vir: Osebne bibliografije
in: SICRIS
To gradivo vam je dostopno v celotnem besedilu. Če kljub temu želite naročiti gradivo, kliknite gumb Nadaljuj.