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Ulaganathan, Chandradevi; Nambiar, Neena; Cornett, Kimberly; Greenwell, Robert L.; Yager, Jeremy A.; Prothro, Benjamin S.; Tham, Kevin; Chen, Suheng; Broughton, Richard S.; Fu, Guoyuan; Blalock, Benjamin J.; Britton, Charles L.; Ericson, M. Nance; Mantooth, H. Alan; Mojarradi, Mohammad M.; Berger, Richard W.; Cressler, John D.
VLSI Design, 01/2010, Letnik: 2010Journal Article
An instrumentation channel is designed, implemented, and tested in a 0.5-μm SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces an assortment of external sensors to signal processing circuits. Also, analog sampling is implemented in the channel using a flying capacitor configuration. The analog samples are digitized by a low-power multichannel A/D converter. Measurement results show that the instrumentation channel supports input signals up to 200 Hz and operates across a wide temperature range of -180°C to 125°C. This work demonstrates the use of a commercially available first generation SiGe BiCMOS process in designing circuits suitable for extreme environment applications.
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JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
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in: SICRIS
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