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Blaiszik, Benjamin J.; Kramer, Sharlotte L. B.; Grady, Martha E.; McIlroy, David A.; Moore, Jeffrey S.; Sottos, Nancy R.; White, Scott R.
Advanced materials (Weinheim), January 17, 2012, Letnik: 24, Številka: 3Journal Article
Self‐healing of an electrical circuit is demonstrated with nearly full recovery of conductance less than one millisecond after damage. Crack damage breaks a conductive pathway in a multilayer device, interrupting electron transport and simultaneously rupturing adjacent microcapsules containing gallium–indium liquid metal (top). The released liquid metal flows to the area of damage, restoring the conductive pathway (bottom).
