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  • Characterization of the VEG...
    Campana, R; Evangelista, Y; Fuschino, F; Ahangarianabhari, M; Macera, D; Bertuccio, G; Grassi, M; Labanti, C; Marisaldi, M; Malcovati, P; Rachevski, A; Zampa, G; Zampa, N; Andreani, L; Baldazzi, G; Monte, E Del; Favre, Y; Feroci, M; Muleri, F; Rashevskaya, I; Vacchi, A; Ficorella, F; Giacomini, G; Picciotto, A; Zuffa, M

    Journal of instrumentation, 08/2014, Letnik: 9, Številka: 8
    Journal Article

    Low-noise, position-sensitive Silicon Drift Detectors (SDDs) are particularly useful for experiments in which a good energy resolution combined with a large sensitive area is required, as in the case of X-ray astronomy space missions and medical applications. This paper presents the experimental characterization of VEGA, a custom Application Specific Integrated Circuit (ASIC) used as the front-end electronics for XDXL-2, a large-area (30.5 cm super(2)) SDD prototype. The ASICs were integrated on a specifically developed PCB hosting also the detector. Results on the ASIC noise performances, both stand-alone and bonded to the large area SDD, are presented and discussed.