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Li, Haoqiang; Zuo, Shikai
Journal of physics. Conference series, 11/2023, Letnik: 2645, Številka: 1Journal Article
Abstract This article presents a novel functional verification methodology based on the Universal Verification Methodology (UVM) to validate the functionality of the Quick Serial Peripheral Interface (QSPI) module. QSPI serves as a prevalent serial communication protocol widely employed for high-speed data exchange with external flash devices. By using the code coverage and functional coverage reports provided by UVM, we were able to assess how well the test cases covered the design code, identifying the parts of the design that had been adequately tested and those that needed more test coverage. This verification method based on UVM provides powerful tools and technical support for the design and development of the QSPI module and effectively ensures its reliability and stability. This study is of great significance for further improving the design quality and verification efficiency of the QSPI module.
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Leto | Faktor vpliva | Izdaja | Kategorija | Razvrstitev | ||||
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JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
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