Planar ortho-mode transducers (OMTs) are a commonly used method of coupling optical signals between waveguides and on-chip circuitry and detectors. While the ideal OMT–waveguide coupling requires minimal disturbance to the waveguide, when used for mm-wave applications the waveguide is typically constructed from two sections to allow the OMT probes to be inserted into the waveguide. This break in the waveguide is a source of signal leakage and can lead to loss of performance and increased experimental systematic errors. Here, we report on the development of new OMT-to-waveguide coupling structures with the goal of reducing leakage at the detector wafer interface. The pixel-to-pixel optical leakage due to the gap between the coupling waveguide and the backshort is reduced by means of a protrusion that passes through the OMT membrane and electrically connects the two waveguide sections on either side of the wafer. High-frequency electromagnetic simulations indicate that these protrusions are an effective method to reduce optical leakage in the gap by ∼ 80 % percent, with a ∼ 60 % filling factor, relative to an standard OMT coupling architecture. Prototype devices have been designed to characterize the performance of the new design using a relative measurement with varying filling factors. We outline the simulation setup and results and present a chip layout and sample box that will be used to perform the initial measurements.