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D M Heim; Pugach, N G; Kupriyanov, M Yu; Goldobin, E; Koelle, D; Kleiner, R; Ruppelt, N; Weides, M; Kohlstedt, H
New journal of physics, 11/2015, Letnik: 17, Številka: 11Journal Article
Using the Usadel approach, we provide a formalism that allows us to calculate the critical current density of 21 different types of Josephson junctions (JJs) with a ferromagnetic (F) barrier and additional insulating (I) or/and normal (N) layers inserted between the F layer and superconducting (S) electrodes. In particular, we obtain that in SFS JJs, even a thin additional N layer between the S layer and F layer may noticeably change the thickness \({d}_{{\rm{F}}}\) of the F layer at which the 0-π transitions occur. For certain values of \({d}_{{\rm{F}}},\) a 0-π transition can even be achieved by changing only the N layer thickness. We use our model to fit experimental data of SIFS and SINFS tunnel junctions.
