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  • Sub-threshold SRAM bit cell...
    Chien, Y C; Chiang, I H; Wang, J S

    Electronics letters, 09/2014, Letnik: 50, Številka: 20
    Journal Article

    The bit cell is a key component that determines the VDDmin and power consumption of a sub-threshold static random access memory. In this paper, a new bit cell with a pnn-type latch structure is proposed. The analysis and measurement results indicate that the pnn bit cell outperforms the conventional bit cells in terms of VDDmin and power reduction.