X-ray microscopy :: COBISS+

Faculty of Electrical Engineering, Lj. (FERLJ)

X-ray microscopy

Cosslett, Vernon Ellis ; Nixon, W. C.

Type of material - book

Publication and manufacture - Cambridge : University Press, 1960

Language - english

COBISS.SI-ID - 6597716

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Cosslett, Vernon Ellis | Nixon, W. C.

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Faculty of Electrical Engineering, Lj.	available - outside loan, loan period: 14 days

Call number – location, accession no. ...	Copy status
53 079 IN: 0015039	available - outside loan, loan period: 14 days

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Cosslett, Vernon Ellis
Nixon, W. C.

Source: Personal bibliographies and: SICRIS

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