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An introduction to surface analysis by XPS and AESWatts, John F. ; Wolstenholme, JohnType of material - book ; adult, seriousEdition - 2nd ed.Publication and manufacture - Hoboken ; Chichester : J. Wiley, cop. 2020Language - englishISBN - 978-1-119-41758-3COBISS.SI-ID - 131440643
Author
Watts, John F. |
Wolstenholme, John
Topics
Surfaces (Technology) |
Analysis |
Electron spectroscopy |
fizika površin |
analitska kemija |
kemijska analiza |
kvalitativna analiza |
kvantitativna analiza |
površinska analiza |
elektronske spektroskopske tehnike |
elektronska spektroskopija |
XPS |
AES |
SAM |
AES/SAM |
ARXPS |
materiali |
preiskave materialov
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FS 0000000999/2nd ed. IN: 020220191 FS 999/2nd ed. IN: 020220191 |
on loan - outside loan, due date: not specified
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Database name | Field | Year |
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Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
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Watts, John F. | |
Wolstenholme, John |
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