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Elektronska vrstična mikroskopija pri povišanem tlaku (ESEM) = The environmental scanning electron microscopy (ESEM)Bončina, TonicaSource: Vakuumist : glasilo Društva za vakuumsko tehniko Slovenije. - ISSN 0351-9716 (Letn. 31, št. 2, jun. 2011, str. 14-19)Type of material - article, component partPublish date - 2011Language - slovenianCOBISS.SI-ID - 15158294
Author
Bončina, Tonica
Topics
okoljski vrstični elektronski mikroskop |
sekundarni okoljski elektroni |
plinski detektor za sekundarne ione |
reducirna zaslonka |
environmental scanning electron microscopy |
secondary environmental electrons |
gaseous detector for secondary electrons |
pressure-limiting-aperture
source: Vakuumist : glasilo Društva za vakuumsko tehniko Slovenije. - ISSN 0351-9716 (Letn. 31, št. 2, jun. 2011, str. 14-19)
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Bončina, Tonica | 14334 |
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