XPS-analiza Ni3Al in TiAl3, ionsko nitriranega v pulzirajoči plazmi; An XPS analysis of Ni3Al and TiAl3 ion nitrided in a pulsed plasma

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XPS-analiza Ni3Al in TiAl3, ionsko nitriranega v pulzirajoči plazmi = An XPS analysis of Ni3Al and TiAl3 ion nitrided in a pulsed plasma

Torkar, Matjaž ; Rosenband, Valery

Visoka trdota in nizek koeficient trenja sta ključna parametra pri modernih nanosih in nanokompozitnih tankih plasteh za zmanjšanje obrabe. Kompleksni nitridi intermetalnih zlitin na osnovi titana, ... aluminija, niklja in železa so obetajoči materiali za visokozmogljive nanose. Preizkušeno je bilo ionsko nitriranje v pulzirajoči plazmi Ni3Al in TiAl3, ki sta bila izdelana po SHS (Self propagating high temperature synthesis)-metodi sinteze iz mešanice elementnih prahov v atmosferi argona. Vsebnost in vrsta nitridov je bila določena z XPS-metodo. Raziskava je potrdila vsebnost nitridov z vezavno energijo 397,2 eV ter nastanek nitridov AlN z vezavno energijo Al 2p 74,6 eV na Ni3Al, medtem ko nitridov TiN na zlitini TiAl3 nismo potrditi, verjetno zaradi prenizke temperature ionskega nitriranja.

Source: Materiali in tehnologije = Materials and technology. - ISSN 1580-2949 (Letn. 37, št. 6, nov.-dec. 2003, str. 365-368)

Type of material - article, component part

Publish date - 2003

Language - slovenian

COBISS.SI-ID - 327338

Link(s):
Digitalna knjižnica Slovenije - dLib.si

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Author
Torkar, Matjaž | Rosenband, Valery

Topics
tanke plasti | trde plasti | nitridi | rentgenska fotoelektronska spektroskopija | rentgenska fotoelektronska spektroskopija

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source: Materiali in tehnologije = Materials and technology. - ISSN 1580-2949 (Letn. 37, št. 6, nov.-dec. 2003, str. 365-368)

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Torkar, Matjaž	05438
Rosenband, Valery

Source: Personal bibliographies and: SICRIS

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