Search results Cho, Changmin NUK :: COBISS+

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91.	Highly Scalable 2nd-Generation 45-nm Split-Gate Embedded Flash with 10-ns Access Time and 1M-Cycling Endurance Yong Kyu Lee; Hongkook Min; Changmin Jeon ... 2016 IEEE 8th International Memory Workshop (IMW) Conference Proceeding We present a highly scalable 2nd generation 45-nm split-gate embedded flash, which has been scaled of 40% unit-cell-size (almost same size with 28-nm technology node) from the 1st generation 45-nm ...	Full text
92.	A safe microcontroller with silent CRC calculation hardware for code ROM integrity verification in IEC-60730 class-B Daejin Park; Tag Gon Kim; Geunrae Cho ... The 1st IEEE Global Conference on Consumer Electronics 2012, 2012-Oct. Conference Proceeding The microcontroller chip for motor driver, industrial appliance, and automotive chips are required to provide methods for detecting unsafe conditions by software-driven or hardware support, such as ...	Full text
93.	CYR61 synthesis is Induced by Interleukin-6 and Promotes Migration and Invasion of Fibroblast-like Synoviocytes in Rheumatoid Arthritis Research Square (Research Square) Publication Open access	Full text PDF
94.	A 45-nm logic compatible 4Mb-split-gate embedded flash with 1M-cycling-endurance Yong Kyu Lee; Boyoung Seo; Tea-Kwang Yu ... 2014 IEEE 6th International Memory Workshop (IMW) Conference Proceeding For the first time, 4Mb split-gate type embedded flash is developed in 45-nm technology with 1M cycling endurance for mass production of various applications. Process integration is designed for ...	Full text