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Analiza tankoplastnih detektorskih struktur iz amorfnega silicija za detekcijo ultravijoličnega sevanja : doktorska disertacijaJankovec, MarkoType of material - dissertation ; adult, seriousPublication and manufacture - Ljubljana : [M. Jankovec], 2005Language - slovenianCOBISS.SI-ID - 4596820
Author
Jankovec, Marko
Other authors
Topič, Marko
Topics
optoelektronika |
polprevodniki |
tankoplastna tehnologija |
amorfni materiali |
disertacije |
amorfni silicij |
detektorji |
simulacije |
električni šum |
semiconductors |
amorphous silicon |
detectors |
thin-film technology |
sumulations |
electrical noise
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Skladišče II 0000061409 Skladišče II 61409 |
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Database name | Field | Year |
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Links to authors' personal bibliographies | Links to information on researchers in the SICRIS system |
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Jankovec, Marko | 20184 |
Topič, Marko | 12609 |
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