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Peer reviewed
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Yao, Y.; Ishikawa, Y.; Sugawara, Y.; Takahashi, Y.; Hirano, K.
Journal of electronic materials, 09/2018, Volume: 47, Issue: 9Journal Article
Synchrotron monochromatic-beam x-ray topography observation has been performed on high-quality ammonothermal gallium nitride single crystal to evaluate threading dislocations (TD) in a nondestructive manner. Asymmetric diffractions with six equivalent g -vectors of 11–26, in addition to a symmetric diffraction with g = 0008, were applied to determine the Burgers vectors ( b ) of dislocations. It was found that pure edge-type TDs with b = 11 - 20 / 3 did not exist in the sample. A dominant proportion of TDs were of mixed type with b = 11 - 20 / 3 + 0001 , i.e., so-called c + a dislocations. Pure 1 c screw dislocations with b = 0001 and TDs with c -component larger than 1 c were also observed.
