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  • Experimental Limits on Sola...
    Zhang, Z Y; Yang, L T; Yue, Q; Kang, K J; Li, Y J; An, H P; C, Greeshma; Chang, J P; Chen, Y H; Cheng, J P; Dai, W H; Deng, Z; Fang, C H; Geng, X P; Gong, H; Guo, Q J; Guo, T; Guo, X Y; He, L; He, S M; Hu, J W; Huang, H X; Huang, T C; Jiang, L; Karmakar, S; Li, H B; Li, H Y; Li, J M; Li, J; Li, Q Y; Li, R M J; Li, X Q; Li, Y L; Liang, Y F; Liao, B; Lin, F K; Lin, S T; Liu, J X; Liu, S K; Liu, Y D; Liu, Y; Liu, Y Y; Ma, H; Mao, Y C; Nie, Q Y; Ning, J H; Pan, H; Qi, N C; Ren, J; Ruan, X C; Singh, M K; Sun, T X; Tang, C J; Tian, Y; Wang, G F; Wang, J Z; Wang, L; Wang, Q; Wang, Y F; Wang, Y X; Wong, H T; Wu, S Y; Wu, Y C; Xing, H Y; Xu, R; Xu, Y; Xue, T; Yan, Y L; Yi, N; Yu, C X; Yu, H J; Yue, J F; Zeng, M; Zeng, Z; Zhang, B T; Zhang, F S; Zhang, L; Zhang, Z H; Zhao, J Z; Zhao, K K; Zhao, M G; Zhou, J F; Zhou, Z Y; Zhu, J J

    Physical review letters, 04/2024, Volume: 132, Issue: 17
    Journal Article

    Recently a dark matter-electron (DM-electron) paradigm has drawn much attention. Models beyond the standard halo model describing DM accelerated by high energy celestial bodies are under intense examination as well. In this Letter, a velocity components analysis (VCA) method dedicated to swift analysis of accelerated DM-electron interactions via semiconductor detectors is proposed and the first HPGe detector-based accelerated DM-electron analysis is realized. Utilizing the method, the first germanium based constraint on sub-GeV solar reflected DM-electron interaction is presented with the 205.4  kg·day dataset from the CDEX-10 experiment. In the heavy mediator scenario, our result excels in the mass range of 5-15  keV/c^{2}, achieving a 3 orders of magnitude improvement comparing with previous semiconductor experiments. In the light mediator scenario, the strongest laboratory constraint for DM lighter than 0.1  MeV/c^{2} is presented. The result proves the feasibility and demonstrates the vast potential of the VCA technique in future accelerated DM-electron analyses with semiconductor detectors.