E-resources
PDF-
Niozu, A; Kumagai, Y; Nishiyama, T; Fukuzawa, H; Motomura, K; Bucher, M; Ito, Y; Takanashi, T; Asa, K; Sato, Y; You, D; Li, Y; Ono, T; Kukk, E; Miron, C; Neagu, L; Callegari, C; Fraia, M Di; Rossi, G; Galli, D E; Pincelli, T; Colombo, A; Kameshima, T; Joti, Y; Hatsui, T; Owada, S; Katayama, T; Togashi, T; Tono, K; Yabashi, M; Matsuda, K; Bostedt, C; Nagaya, K; Ueda, K
Journal of physics. Conference series, 01/2020, Volume: 1412, Issue: 20Journal Article
Synopsis We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
