Imaging examinations are often performed in patients with Legionnaires' disease. The literature to date has documented that the imaging findings in this disorder are relatively nonspecific, and it is ...therefore difficult to prospectively differentiate legionella pneumonia from other forms of pneumonia, and from other noninfectious thoracic processes. Through a review of clinical cases and the literature, our objective is for the reader to gain a better understanding of the spectrum of radiographic manifestations of Legionnaires' disease.
Nickel implanted silicon substrate shows potential applications for the fabrication of infrared detectors, solar cells, spintronic devices as well as for the synthesis of an embedded nickel silicide ...layer inside Si substrates. Emerging applications of the transition metal implanted silicon structures for the fabrication of intermediate band materials motivated us to study the in-depth distribution profile of Ni ions as well as the structural changes that occur at the top of silicon substrate surface before and after annealing process. In the present work, we have carried out detailed study on the crystalline silicon substrates, implanted with Ni− ions comprising ion dose value of 5 × 1016 ions/cm2 at 100 keV implantation energy followed with the post implantation annealing at 800 °C temperature for a time duration of 2 h. The distribution profile of nickel ions inside the silicon substrate was estimated using the non-destructive simultaneous XRR-GIXRF measurements and were also compared with results obtained from the RBS and SIMS measurements. The in-depth concentration profile of Ni ions inside Si substrate derived from XRR-GIXRF measurements was found to be in close agreement with that of obtained from the RBS measurements. Furthermore, our investigations clearly showed that the annealing process causes the inward and outward diffusion of the Ni atoms inside the Si substrate, thus significantly changing the in-depth concentration profile of Ni ions in the Si matrix. The XANES and EXAFS results also demonstrate the formation of NiSi2 phase around Ni atoms in the implanted region of Si 〈100〉 substrate.
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•Implantation of transition metals plays an important role for the production of intermediate band materials.•GIXRF technique allows reliable depth distribution analysis of implanted ions inside a substrate.•The GIXRF method considerably eliminates the limitations of the conventional techniques e.g RBS, SIMS, etc.•Direct implantation of Ni ions in Si matrix is one of the simplest methods for the nickel silicide synthesis.
Invasion of human erythrocytes by Plasmodium falciparum merozoites involves multiple interactions between host receptors and their merozoite ligands. Here we report human Cyclophilin B as a receptor ...for PfRhopH3 during merozoite invasion. Localization and binding studies show that Cyclophilin B is present on the erythrocytes and binds strongly to merozoites. We demonstrate that PfRhopH3 binds to the RBCs and their treatment with Cyclosporin A prevents merozoite invasion. We also show a multi-protein complex involving Cyclophilin B and Basigin, as well as PfRhopH3 and PfRh5 that aids the invasion. Furthermore, we report identification of a de novo peptide CDP3 that binds Cyclophilin B and blocks invasion by up to 80%. Collectively, our data provide evidence of compounded interactions between host receptors and merozoite surface proteins and paves the way for developing peptide and small-molecules that inhibit the protein-protein interactions, individually or in toto, leading to abrogation of the invasion process.
Over the past 10 years, there has been increased attending-level image interpretation during what has typically been considered the on-call period. The purpose of this study is to survey radiology ...attending physicians and assess their perceptions about how the presence of radiology attending physicians during the on-call period affects patient care and resident education. Two hundred eighty-eight radiology attendings completed the online survey. 70% believe that after hours final reads by radiology attendings improves patient care. 56% believe that this additional attending presence has a negative impact on the ability of graduating residents to efficiently interpret studies independently. A majority of radiology attending physicians in this study believe that increased in-house radiology attending coverage is harming resident training across the United States, yet also believe this attending presence is important for patient care. Additional studies are needed to quantify and further evaluate this effect, and develop strategies to address potential negative impacts on radiology resident education.
Radiology residency training has undergone substantial changes, including increased utilization of night float systems, late and/or overnight attending radiology in-house coverage (LOAR), and ...restructuring of the radiology boards. The purpose of this study is to evaluate radiology residents’ perceptions regarding these changes and their impact on resident training using an anonymous, web-based survey that was distributed to radiology residents across the United States. A total of 345 current radiology residents completed the survey. A substantial number of radiology residents perceive that LOARs have negative impact on their development of independence and efficiency during the on call period. Residents are concerned about the timing of the core exam and match fellowship interviews, the timing of the certifying exam, and that graduating as board-eligible radiologists will harm their job search.
Energy dispersive X-ray fluorescence (EDXRF) is a widely used non-destructive technique for micro and trace multi-element analysis of materials. Conventional trials show that using laboratory ...assisted EDXRF measurements, one can obtain elemental detection limits in the range of {\mu}g/g to sub-{\mu}g/g level. In the present work a quantitative approach has been followed in attempting to explore how is it possible to obtain elemental detection limit in the range of ng/g by using simple EDXRF excitation (45{\deg}- 45{\deg} geometry) instead of using total reflection X-ray fluorescence (TXRF) technique, which renders relatively superior detection limits for different elements. In order to accomplish this, we recorded fluorescence spectrum from a standard reference sample (ICP-IV) in similar experimental conditions. The results show that using a very small quantity of sample on top of a thin kapton foil with a thickness ranging between 25-50 {\mu}m, as a sample carrier, the EDXRF technique may offer comparable elemental detection limits in contrast to TXRF technique.
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