NUK - logo

Rezultati iskanja

Osnovno iskanje    Ukazno iskanje   

Trenutno NISTE avtorizirani za dostop do e-virov NUK. Za polni dostop se PRIJAVITE.

1 2 3
zadetkov: 25
1.
  • Ground-State Equilibrium Th... Ground-State Equilibrium Thermodynamics and Switching Kinetics of Bistable [2]Rotaxanes Switched in Solution, Polymer Gels, and Molecular Electronic Devices
    Choi, Jang Wook; Flood, Amar H.; Steuerman, David W. ... Chemistry, December 16, 2005, Letnik: 12, Številka: 1
    Journal Article
    Recenzirano
    Odprti dostop

    We report on the kinetics and ground‐state thermodynamics associated with electrochemically driven molecular mechanical switching of three bistable 2rotaxanes in acetonitrile solution, polymer ...
Celotno besedilo
2.
  • Infrared Spectroscopic Char... Infrared Spectroscopic Characterization of [2]Rotaxane Molecular Switch Tunnel Junction Devices
    DeIonno, Erica; Tseng, Hsian-Rong; Harvey, Desmond D ... The journal of physical chemistry. B, 04/2006, Letnik: 110, Številka: 15
    Journal Article
    Recenzirano

    Langmuir−Blodgett monolayers of a bistable 2rotaxane were prepared at packing densities of 118, 73, and 54 Å2/molecule. The monolayers were both characterized via infrared spectroscopy before and ...
Celotno besedilo
3.
  • Spiers Memorial Lecture. Mo... Spiers Memorial Lecture. Molecular mechanics and molecular electronics
    Beckman, Robert; Beverly, Kris; Boukai, Akram ... Faraday discussions, 2006, Letnik: 131
    Journal Article
    Recenzirano
    Odprti dostop

    We describe our research into building integrated molecular electronics circuitry for a diverse set of functions, and with a focus on the fundamental scientific issues that surround this project. In ...
Celotno besedilo

PDF
4.
Celotno besedilo

PDF
5.
  • A 160-kilobit molecular electronic memory patterned at 10(11) bits per square centimetre
    Green, Jonathan E; Choi, Jang Wook; Boukai, Akram ... Nature (London), 2007-Jan-25, 20070125, Letnik: 445, Številka: 7126
    Journal Article
    Recenzirano

    The primary metric for gauging progress in the various semiconductor integrated circuit technologies is the spacing, or pitch, between the most closely spaced wires within a dynamic random access ...
Celotno besedilo
6.
  • Reliability considerations ... Reliability considerations and radiation testing of memristor devices
    DeIonno, Erica; White, Allyson L. 2015 IEEE Aerospace Conference, 2015-March
    Conference Proceeding

    Resistive random access memories (RRAM) can be made of a variety of materials, including metal oxides and metal-doped chalcogenides, that exhibit memristive behavior. RRAMs have been identified as a ...
Celotno besedilo
7.
Celotno besedilo
8.
  • Structures and Properties o... Structures and Properties of Self-Assembled Monolayers of Bistable [2]Rotaxanes on Au (111) Surfaces from Molecular Dynamics Simulations Validated with Experiment
    Jang, Seung Soon; Jang, Yun Hee; Kim, Yong-Hoon ... Journal of the American Chemical Society, 02/2005, Letnik: 127, Številka: 5
    Journal Article
    Recenzirano

    Bistable 2rotaxanes display controllable switching properties in solution, on surfaces, and in devices. These phenomena are based on the electrochemically and electrically driven mechanical shuttling ...
Celotno besedilo
9.
  • Single Event Susceptibility... Single Event Susceptibility Analysis in CBRAM Resistive Memory Arrays
    Mahalanabis, Debayan; Rui Liu; Barnaby, Hugh J. ... IEEE transactions on nuclear science, 2015-Dec., 2015-12-00, 20151201, Letnik: 62, Številka: 6
    Journal Article
    Recenzirano

    Ion-strike-induced single event transients in a type of nonvolatile resistive memory known as conductive bridge resistive memory (CBRAM) are investigated. Experimental data demonstrating bit upsets ...
Celotno besedilo
10.
  • Sensitivity of metal oxide ... Sensitivity of metal oxide memristors to radiation-induced displacement damage
    DeIonno, Erica; White, Allyson L. 2014 IEEE Aerospace Conference, 2014-March
    Conference Proceeding

    Over the last several years, various research groups have shown that metal oxide-based memristors or resistive random access memory (RRAM) components are tolerant to high levels of both displacement ...
Celotno besedilo
1 2 3
zadetkov: 25

Nalaganje filtrov