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zadetkov: 58
1.
  • Influence of carrier locali... Influence of carrier localization on high-carrier-density effects in AlGaN quantum wells
    Mickevičius, Jūras; Jurkevičius, Jonas; Tamulaitis, Gintautas ... Optics express, 03/2014, Letnik: 22 Suppl 2, Številka: S2
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    The influence of carrier localization on photoluminescence efficiency droop and stimulated emission is studied in AlGaN multiple quantum wells with different strength of carrier localization. We ...
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2.
  • Hot-electron micro & nanobo... Hot-electron micro & nanobolometers based on low-mobility 2DEG for high resolution THz spectroscopy
    Mitin, Vladimir; Pogrebnyak, Victor; Shur, Michael ... Journal of physics. Conference series, 03/2014, Letnik: 486, Številka: 1
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    The results on design, fabrication, and characterization of a hot-electron bolometer (HEB) based on the low-mobility two-dimensional electron gas (2DEG) in a AlGaN/GaN heterostructures show that our ...
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3.
  • Photomodification of carrie... Photomodification of carrier lifetime and diffusivity in AlGaN epitaxial layers
    Podlipskas, Žydrūnas; Aleksiejūnas, Ramūnas; Nargelas, Saulius ... Current applied physics, June 2016, 2016-06-00, 20160601, 2016-06, Letnik: 16, Številka: 6
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    Nonradiative recombination rate and diffusivity of nonequilibrium carriers were modified by intense laser pulses in AlGaN epilayers with Al content ranging from 16 to 71%. The epilayers were examined ...
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4.
  • Deep-Ultraviolet Light-Emit... Deep-Ultraviolet Light-Emitting Diodes
    Shur, M.S.; Gaska, R. IEEE transactions on electron devices, 2010-Jan., 2010-01-00, 20100101, Letnik: 57, Številka: 1
    Journal Article
    Recenzirano

    Compact solid-state deep-ultraviolet (DUV) light-emitting diodes (LEDs) go far beyond replacing conventional DUV sources such as mercury lamps. DUV LEDs enable new applications for air, water, and ...
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5.
  • Impact of Photocapacitance ... Impact of Photocapacitance on Phase Response of GaN/Sapphire SAW UV Sensor
    Chivukula, V.S.; Ciplys, D.; Rimeika, R. ... IEEE sensors journal, 04/2010, Letnik: 10, Številka: 4
    Journal Article
    Recenzirano

    The response of GaN/sapphire SAW delay line to the focused ultraviolet (UV) illumination was investigated at the SAW frequency 306 MHz and optical wavelength 375 nm. The UV irradiation of an ...
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6.
  • Scanning near-field optical... Scanning near-field optical spectroscopy of AlGaN epitaxial layers
    Pinos, Andrea; Marcinkevičius, Saulius; Liuolia, Vytautas ... Physica status solidi. C, July 2012, Letnik: 9, Številka: 7
    Journal Article
    Recenzirano

    Band gap fluctuations and carrier localization in AlxGa1‐xN films with x values varying from 0.30 to 0.50 has been studied by scanning near‐field optical microscopy (SNOM) by measuring ...
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7.
  • Growth and characterization... Growth and characterization of epitaxial layers on aluminum nitride substrates prepared from bulk, single crystals
    Carlos Rojo, J.; Schowalter, Leo J.; Gaska, Remis ... Journal of crystal growth, 05/2002, Letnik: 240, Številka: 3
    Journal Article
    Recenzirano

    A comparative study of epitaxy of AlN, GaN and their alloys, grown on c-axis and off-axis substrates of single-crystal aluminum nitride has been carried out. Growth on off-axis (>30°) substrates ...
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8.
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9.
  • Low RC-Constant Perforated-... Low RC-Constant Perforated-Channel HFET
    Simin, Grigory S.; Islam, Mirwazul; Gaevski, Mikhail ... IEEE electron device letters, 04/2014, Letnik: 35, Številka: 4
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    The novel HFET design using perforated channel region under the gate reduces drain and source parasitic resistances due to the current spreading effect in the source-gate and gate-drain regions. ...
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10.
  • Photoluminescence efficienc... Photoluminescence efficiency droop and stimulated recombination in GaN epilayers
    Mickevičius, Jūras; Jurkevičius, Jonas; Shur, Michael S ... Optics express, 2012-Nov-05, 2012-11-05, 20121105, Letnik: 20, Številka: 23
    Journal Article
    Recenzirano
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    The photoluminescence droop effect, i.e., the decrease in emission efficiency with increasing excitation intensity, is observed and studied in GaN epilayers with different carrier lifetimes. ...
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zadetkov: 58

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