The Born cross sections of the process \(e^{+}e^{-}\to D^{*0}D^{*-}\pi^{+}\) at center-of-mass energies from 4.189 to 4.951 GeV are measured for the first time. The data samples used correspond to an ...integrated luminosity of \(17.9\,{\rm fb}^{-1}\) and were collected by the BESIII detector operating at the BEPCII storage ring. Three enhancements around 4.20, 4.47 and 4.67 GeV are visible. The resonances have masses of \(4209.6\pm4.7\pm5.9\,{\rm MeV}/c^{2}\), \(4469.1\pm26.2\pm3.6\,{\rm MeV}/c^{2}\) and \(4675.3\pm29.5\pm3.5\,{\rm MeV}/c^{2}\) and widths of \(81.6\pm17.8\pm9.0\,{\rm MeV}\), \(246.3\pm36.7\pm9.4\,{\rm MeV}\), and \(218.3\pm72.9\pm9.3\,{\rm MeV}\), respectively, where the first uncertainties are statistical and the second systematic. The first and third resonances are consistent with the \(\psi(4230)\) and \(\psi(4660)\) states, respectively, while the second one is compatible with the \(\psi(4500)\) observed in the \(e^{+}e^{-}\to K^{+}K^{-}J/\psi\) process. These three charmoniumlike \(\psi\) states are observed in \(e^{+}e^{-}\to D^{*0}D^{*-}\pi^{+}\) process for the first time.
Using \(e^+e^-\) collision data corresponding to an integrated luminosity of 7.33 \({\rm fb^{-1}}\) recorded by the BESIII detector at center-of-mass energies between 4.128 and 4.226 \({\rm GeV}\), ...we present an analysis of the decay \(D_{s}^{+} \to f_{0}(980)e^{+}\nu_{e}\) with \(f_{0}(980) \to \pi^{+}\pi^{-}\), where the \(D_s^+\) is produced via the process \(e^+e^- \to D_{s}^{*\pm}D_{s}^{\mp}\). We observe the \(f_{0}(980)\) in the \(\pi^+\pi^-\) system and the branching fraction of the decay \(D_{s}^{+} \to f_{0}(980)e^{+}\nu_{e}\) with \(f_0(980)\to\pi^+\pi^-\) is measured to be \((1.72 \pm 0.13_{\rm stat} \pm 0.10_{\rm syst}) \times10^{-3}\), where the uncertainties are statistical and systematic, respectively. The dynamics of the \(D_{s}^{+} \to f_{0}(980)e^{+}\nu_{e}\) decay are studied with the simple pole parameterization of the hadronic form factor and the Flatté formula describing the \(f_0(980)\) in the differential decay rate, and the product of the form factor \(f^{f_0}_{+}(0)\) and the \(c\to s\) Cabibbo-Kobayashi-Maskawa matrix element \(|V_{cs}|\) is determined for the first time to be \(f^{f_0}_+(0)|V_{cs}|=0.504\pm0.017_{\rm stat}\pm0.035_{\rm syst}\).
Based on \((448.1 \pm 2.9 )\times 10^6\) \(\psi(3686)\) events collected with the BESIII detector operating at the BEPCII collider, the decay \(\psi(3686)\rightarrow \phi K_{S}^{0} K_{S}^{0}\) is ...observed for the first time. Taking the interference between \(\psi(3686)\) decay and continuum production into account, the branching fraction of this decay is measured to be \(\mathcal{B}(\psi(3686)\rightarrow\phi K_S^0 K_S^0 )\) = \((3.53 \) \(\pm\) \(0.20\) \(\pm\) \(0.21\))\(\times 10^{-5}\), where the first uncertainty is statistical and the second is systematic. Combining with the world average value for \({\mathcal B}(J/\psi\to \phi K^0_SK^0_S)\), the ratio \(\mathcal{B}(\psi(3686)\rightarrow \phi K_{S}^{0} K_{S}^{0})/\mathcal{B}(J/\psi\rightarrow \phi K_{S}^{0} K_{S}^{0}) \) is determined to be \((6.0\pm 1.6)\)%, which is suppressed relative to the 12% rule.
Using initial-state radiation events from a total integrated luminosity of 11.957 fb\(^{-1}\) of \(e^+e^-\) collision data collected at center-of-mass energies between 3.773 and 4.258 GeV with the ...BESIII detector at BEPCII, the cross section for the process \(e^{+}e^{-}\rightarrow\Lambda\bar{\Lambda}\) is measured in 16 \(\Lambda\bar{\Lambda}\) invariant mass intervals from the production threshold up to 3.00 GeV\(/c^{2}\). The results are consistent with previous results from BaBar and BESIII, but with better precision and with narrower \(\Lambda\bar{\Lambda}\) invariant mass intervals than BaBar.
A narrow structure in the \(p\bar{\Lambda}\) system near the mass threshold, named as \(X(2085)\), is observed in the process \(e^+e^- \to p K^-\bar{\Lambda}\) with a statistical significance greater ...than \(20\sigma\). Its spin and parity are determined for the first time to be \(J^P=1^+\) in an amplitude analysis, with statistical significance greater than \(5\sigma\) over other quantum numbers. The pole positions of \(X(2085)\) are measured to be \(M_{\rm pole}=(2086\pm4\pm6)\)~MeV and \(\Gamma_{\rm pole}=(56\pm5\pm16)\) MeV, where the first uncertainties are statistical and the second ones are systematic. The analysis is based on the study of the process \(e^+e^-\to pK^-\bar{\Lambda}\) and uses the data samples collected with the BESIII detector at the center-of-mass energies \(\sqrt{s}=4.008\), \(4.178\), \(4.226\), \(4.258\), \(4.416\), and \(4.682\) GeV with a total integrated luminosity of \(8.35~\text{fb}^{-1}\).
Using (447.9 \(\pm\) 2.3) million \(\psi\)(3686) events collected with the BESIII detector, the decays of \(\chi_{cJ} \rightarrow \phi\phi\) (\(J\)=0, 1, 2) have been studied via the decay ...\(\psi(3686)\rightarrow\gamma\chi_{cJ}\). The branching fractions of the decays \(\chi_{cJ} \rightarrow \phi\phi\) (\(J\)=0, 1, 2) are determined to be \((8.48\pm0.26\pm0.27)\times10^{-4}\), \((4.36\pm0.13\pm0.18)\times10^{-4}\), and \((13.36\pm0.29\pm0.49)\times10^{-4}\), respectively, which are the most precise measurements to date. From a helicity amplitude analysis of the process \(\psi(3686) \rightarrow \gamma \chi_{cJ}, \chi_{cJ}\rightarrow \phi\phi, \phi\rightarrow K^{+}K^{-}\), the polarization parameters of the \(\chi_{cJ} \rightarrow \phi\phi\) decays are determined for the first time.
The decays \(J/\psi\to\eta\Sigma^{+}\bar{\Sigma}{}^-\) and \(\psi(3686)\to\eta\Sigma^{+}\bar{\Sigma}{}^-\) are observed for the first time, using \((10087 \pm 44)\times 10^{6}\) \(J/\psi\) and ...\((448.1 \pm 2.9)\times 10^{6}\) \(\psi(3686)\) events collected with the BESIII detector at the BEPCII collider. We determine the branching fractions of these two decays to be \({\cal B}(J/\psi\to\eta\Sigma^{+}\bar{\Sigma}{}^-)=(6.34 \pm 0.21 \pm 0.37)\times 10^{-5}\) and \({\cal B}(\psi(3686)\to\eta\Sigma^{+}\bar{\Sigma}{}^-)=(9.59 \pm 2.37 \pm 0.61)\times 10^{-6}\), where the first uncertainties are statistical and the second are systematic. The ratio of these two branching fractions is determined to be \(\frac{{\cal B}(\psi(3686)\to\eta\Sigma^{+}\bar{\Sigma}{}^-)}{{\cal B}(J/\psi\to\eta\Sigma^{+}\bar{\Sigma}{}^-)}=(15.1 \pm 3.8)\%\), which is in agreement with the "12\% rule."
Using a sample of \((10.09\pm0.04)\times10^{9}\) \(J/\psi\) decays collected with the BESIII detector, partial wave analyses of the decay \(J/\psi\to\gamma K^{0}_{S} K^{0}_{S}\pi^{0}\) are performed ...within the \(K^{0}_{S}K^{0}_{S}\pi^{0}\) invariant mass region below \(1.6\mathrm{\ Ge\kern -0.1em V}/c^2\). The covariant tensor amplitude method is used in both mass independent and mass dependent approaches. Both analysis approaches exhibit dominant pseudoscalar and axial vector components, and show good consistency for the other individual components. Furthermore, the mass dependent analysis reveals that the \(K^{0}_{S}K^{0}_{S}\pi^{0}\) invariant mass spectrum for the pseudoscalar component can be well described with two isoscalar resonant states using relativistic Breit-Wigner model, \({\it i.e.}\), the \(\eta(1405)\) with a mass of \(1391.7\pm0.7_{-0.3}^{+11.3}\mathrm{\ Me\kern -0.1em V}/c^2\) and a width of \(60.8\pm1.2_{-12.0}^{+5.5}\mathrm{\ Me\kern -0.1em V}\), and the \(\eta(1475)\) with a mass of \(1507.6\pm1.6_{-32.2}^{+15.5}\mathrm{\ Me\kern -0.1em V}/c^2\) and a width of \(115.8\pm2.4_{-10.9}^{+14.8}\mathrm{\ Me\kern -0.1em V}\). The first and second uncertainties are statistical and systematic, respectively. Alternate models for the pseudoscalar component are also tested, but the description of the \(K^{0}_{S}K^{0}_{S}\pi^{0}\) invariant mass spectrum deteriorates significantly.
The integration of spin-on low dielectric constant materials within existing metallization schemes creates challenges for the material properties and integration technology. The polish ...characteristics of SiLK using commercially available slurries and changes in topology as well as the surface chemistry as result of the interaction with the slurry were investigated by atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). The high planarization capability of a CMP process is demonstrated on a patterned wafer. SILK can therefore be considered as a promising candidate for the replacement of silicon dioxide in an Al/W based interconnect technology.
