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zadetkov: 1.212
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  • Searches for long-lived par... Searches for long-lived particles at the future FCC-ee
    Verhaaren, C. B.; Alimena, J.; Bauer, M. ... Frontiers in physics, 09/2022, Letnik: 10
    Journal Article
    Recenzirano
    Odprti dostop

    The electron-positron stage of the Future Circular Collider, FCC-ee, is a frontier factory for Higgs, top, electroweak, and flavour physics. It is designed to operate in a 100 km circular tunnel ...
Celotno besedilo
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  • Overview of dual damascene ... Overview of dual damascene integration schemes in Cu BEOL integration
    Kriz, J.; Angelkort, C.; Czekalla, M. ... Microelectronic engineering, 10/2008, Letnik: 85, Številka: 10
    Journal Article, Conference Proceeding
    Recenzirano

    An overview of different dual damascene approaches is given. Three approaches – trench first, trench first with metal hardmask, and via first – are described in detail. Trench first is the easiest ...
Celotno besedilo
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  • Low-temperature scanning field emission microscope with polarization analysis
    Thamm, A.-K.; Demydenko, M.; Michlmayr, T. ... 2020 33rd International Vacuum Nanoelectronics Conference (IVNC), 2020-July
    Conference Proceeding

    the design of the low-temperature scanning probe microscope, which works in field emission regime with spin polarization analysis, is proposed. A performance at temperature of 77 K has been achieved. ...
Celotno besedilo
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  • Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer
    Bodik, M; Demydenko, M.; Walker, C. G. H. ... 2021 34th International Vacuum Nanoelectronics Conference (IVNC), 2021-July-5
    Conference Proceeding

    In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. ...
Celotno besedilo
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  • Scanning Field Emission Microscopy with Spin and Energy Analysis
    Thamm, A-K; Wei, J.; Demydenko, M. ... 2021 34th International Vacuum Nanoelectronics Conference (IVNC), 2021-July-5
    Conference Proceeding

    Scanning Field Emission Microscopy with Polarization Analysis was recently introduced to detect the spin polarization of electrons excited in the field emission regime of Scanning Tunnelling ...
Celotno besedilo
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