In this paper we study the wavelength selection process for optical monitoring of thin film filters. We first discuss the technical limitations of monitoring systems as well as the criteria defining ...the sensitivity of different wavelengths to thickness errors. We then present an approach that considers the best monitoring wavelength for each individual layer with a monitoring strategy selection process that can be fully automated. We finally validate experimentally the proposed approach on several optical filters of increasing complexity. Optical interference filters with close to theoretical performances are demonstrated.
Optical monitoring of thin film interference filters is of primary importance for two main reasons: possible error compensation and greater thickness accuracy of the deposited layers compared to ...non-optical methods. For many designs, the latter reason is the most crucial, because for complex designs with a large number of layers, several witness glasses are used for monitoring and error compensation with a classical monitoring approach is no longer possible for the whole filter. One optical monitoring technique that seems to maintain some form of error compensation, even when changing witness glass, is broadband optical monitoring, as it is possible to record the determined thicknesses as the layers are deposited and re-refine the target curves for remaining layers or recalculate the thicknesses of remaining layers. In addition, this method, if used properly, can, in some cases, provide greater accuracy for the thickness of deposited layers than monochromatic monitoring. In this paper, we discuss the process of determining a strategy for broadband monitoring with the goal of minimizing thickness errors for each layer of a given thin film design.
•Heterostructured CuO/WO3 nanowires and thin films were synthesized.•A transition from CuO/WO3 to CuO/CuWO4 occurred on heating in air at 650 °C.•A formation of CuWO4 was confirmed by X-ray ...diffraction and Raman spectroscopy.•Morphology evolution in nanowires and thin films was studied by SEM and TEM.
A comparative study of heterostructured CuO/CuWO4 core/shell nanowires and double-layer thin films was performed through X-ray diffraction, confocal micro-Raman spectroscopy and electron (SEM and TEM) microscopies. The heterostructures were produced using a two-step process, starting from a deposition of amorphous WO3 layer on top of CuO nanowires and thin films by reactive DC magnetron sputtering and followed by annealing at 650 °C in air. The second step induced a solid-state reaction between CuO and WO3 oxides through a thermal diffusion process, revealed by SEM-EDX analysis. Morphology evolution of core/shell nanowires and double-layer thin films upon heating was studied by electron (SEM and TEM) microscopies. A formation of CuWO4 phase was confirmed by X-ray diffraction and confocal micro-Raman spectroscopy.
Core–shell nanowires are an interesting and perspective class of radially heterostructured nanomaterials where epitaxial growth of the shell can be realized even at noticeable core–shell lattice ...mismatch. In this study epitaxial hexagonally shaped shell consisting of WS2 nanolayers was grown on {11̅00} facets of prismatic wurtzite-structured 0001-oriented ZnO nanowires for the first time. A synthesis was performed by annealing in a sulfur atmosphere of ZnO/WO3 core–shell structures, produced by reactive dc magnetron sputtering of an amorphous a-WO3 layer on top of ZnO nanowire array. The morphology and phase composition of synthesized ZnO/WS2 core–shell nanowires were confirmed by scanning and transmission electron microscopy (SEM and TEM), micro-Raman, and photoluminescence spectroscopy. Epitaxial growth of WS2(0001) layer(s) on {11̅00} facets of ZnO nanowire is unexpected due to incompatibility of their symmetry and structure parameters. To relax the interfacial incoherence, we propose a model of ZnO/WS2 interface containing WS2 bridging groups inside and use first-principles simulations to support its feasibility.
A comparative study of heterostructured CuO/CuWO4 core/shell nanowires and double-layer thin films was performed through X-ray diffraction, confocal micro-Raman spectroscopy and electron (SEM and ...TEM) microscopies. The heterostructures were produced using a two-step process, starting from a deposition of amorphous WO3 layer on top of CuO nanowires and thin films by reactive DC magnetron sputtering and followed by annealing at 650 °C in air. The second step induced a solid-state reaction between CuO and WO3 oxides through a thermal diffusion process, revealed by SEM-EDX analysis. Morphology evolution of core/shell nanowires and double-layer thin films upon heating was studied by electron (SEM and TEM) microscopies. A formation of CuWO4 phase was confirmed by X-ray diffraction and confocal micro-Raman spectroscopy.
High-repetition rate diode-pumped sub-ps lasers are widely used in the industrial sector for high-quality material processing applications. However, for their reliable operation, it is crucial to ...study the power handling capabilities of the optical components used in these systems. The optical components, such as mirrors, gratings, dichroic filters, and gain media, are designed based on dielectric thin films. When subjected to high-intensity laser radiation, the phenomenon of laser-induced contamination (LIC) can lead to the growth of a nanometric, highly absorbent layer on an irradiated optical surface, which can result in transmission or reflection loss and eventual permanent damage. In this study, we investigate LIC growth on dielectric oxide thin films in an air environment irradiated by MHz sub-ps laser at 515 nm. We examine the effect of thin film deposition method, material, and thickness on LIC growth dynamics. The irradiated spots on the surface are inspected using multiple observation methods, including white light interference microscopy and fluorescence imaging. Our results show that the LIC growth dynamics depend on the laser intensity and irradiation time and can be affected by the thin film deposition method, material, and thickness. These findings could be used to inform the development of more resistant optical components, ensuring long-term reliable laser operation required for industrial applications. The study highlights the need for validating optical components using tests that closely mimic real-world applications and provides insight into the complex processes that lead to LIC.
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