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Berghoff, G.; Bergeault, E.; Huyart, B.; Jallet, L.
IEEE transactions on instrumentation and measurement, 10/1997, Letnik: 46, Številka: 5Journal Article
The complete calibration of a double six-port network analyzer includes constants for the measurement of wave ratios (S-parameters) as well as constants for absolute power level measurements for nonlinear device characterization. This paper describes how a complete set of constants can be obtained for on-wafer measurements from a complete calibration in a coaxial measurement plane and a subsequent on-wafer calibration with the minimum number of elements.
