E-viri
Recenzirano
-
Shvetsov-Shilovskiy, Ivan I.; Chumakov, Alexander I.; Pechenkin, Alexander A.; Bobrovsky, Dmitry V.
IEEE transactions on nuclear science, 07/2020, Letnik: 67, Številka: 7Journal Article
This article concerns experimental and simulation results on nonstable latchups (SLs) in CMOS integrated circuits (ICs) under pulsed laser irradiation. Different transient responses in elements of the p-n-p-n structure and irregular ionization distribution on the IC surface are the main reasons for non-SLs. Radiation experimental test results are presented as well as a discussion of non-SL mechanisms.
