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Wienholtz, F.; Kreim, S.; Rosenbusch, M.; Schweikhard, L.; Wolf, R.N.
International journal of mass spectrometry, 10/2017, Letnik: 421Journal Article
Display omitted •A new ion selection technique based on multi-reflection time-of-flight mass separation is introduced and characterized.•No further devices, such as ion gates, are needed for beam purification.•Several offline and online examples with short-lived nuclei are presented for illustration. A method for high-resolution mass selection is presented which makes use of a multi-reflection time-of-flight mass spectrometer with in-trap lift. The new method needs no additional gating or deflection components. The concept is described in detail and demonstrated with both offline and online measurements on short-lived nuclides performed with ISOLTRAP at ISOLDE/CERN.
