E-viri
Recenzirano
-
Park, H.H; Lim, J.-D; Park, H.-B; Kim, J
Electronics letters, 05/2016, Letnik: 52, Številka: 11Journal Article
A novel near-field shielding measurement method is presented for small shield cans used in modern mobile devices with metallic cases. To effectively capture electromagnetic leakage through the shield cans at the very near-field region, a stripline mounted on a test board is utilised similar to the integrated circuit stripline method. Using simulation and measurement, it is verified that the proposed method is more accurate and effective than the conventional gigahertz transverse electromagnetic (GTEM) cell measurement method for shielding evaluation of small shield cans used in metallic mobile devices from an radio-frequency interference point of view.
Vnos na polico
Trajna povezava
- URL:
Faktor vpliva
Dostop do baze podatkov JCR je dovoljen samo uporabnikom iz Slovenije. Vaš trenutni IP-naslov ni na seznamu dovoljenih za dostop, zato je potrebna avtentikacija z ustreznim računom AAI.
Leto | Faktor vpliva | Izdaja | Kategorija | Razvrstitev | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Baze podatkov, v katerih je revija indeksirana
Ime baze podatkov | Področje | Leto |
---|
Povezave do osebnih bibliografij avtorjev | Povezave do podatkov o raziskovalcih v sistemu SICRIS |
---|
Vir: Osebne bibliografije
in: SICRIS
To gradivo vam je dostopno v celotnem besedilu. Če kljub temu želite naročiti gradivo, kliknite gumb Nadaljuj.