A Charge Coupled Devices (CCD)-based vertex detector is a leading option for vertex detection at the future linear collider. A major issue for this application is the radiation hardness of such devices. Tests of radiation hardness of CCDs used in the SLD vertex detector, VXD3, have been reported earlier. The first measurements of 1998 involved a spare VXD3 CCD that was irradiated with neutrons from a radioactive source (Pu–Be), and from a nuclear reactor. In 2003, we had the opportunity to disassemble the VXD3 detector and study the nature of the radiation damage it incurred during 3 years of operation at SLC. In the preparation for this study, additional experiments with the spare VXD3 CCD were performed. These included measurements of trapping times in neutron irradiated CCDs. Results, reported here, will help us better understand the mechanism of radiation damage effects and develop techniques to minimize performance degradation due to radiation damage.