NUK - logo
E-viri
Recenzirano Odprti dostop
  • Charge relaxation in a sing...
    Wang, K; Payette, C; Dovzhenko, Y; Deelman, P W; Petta, J R

    Physical review letters, 07/2013, Letnik: 111, Številka: 4
    Journal Article

    We measure the interdot charge relaxation time T1 of a single electron trapped in an accumulation mode Si/SiGe double quantum dot. The energy level structure of the charge qubit is determined using photon assisted tunneling, which reveals the presence of a low-lying excited state. We systematically measure T1 as a function of detuning and interdot tunnel coupling and show that it is tunable over four orders of magnitude, with a maximum of 45  μs for our device configuration.