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Hamdi, B.; Chiraz, K.; Aymen, F.; Rached, T.
ISSCS 2011 - International Symposium on Signals, Circuits and Systems, 2011-JuneConference Proceeding
Self-checking designs will gain increasing interest in industrial applications if they satisfy the following requirements: high fault coverage and reduced hardware cost with reduced design effort. The aim of this work is to contribute to reach these requirements for the design of self-checking adders/ALUs. In this paper, we present efficient self-checking XOR implementation for schemes using the dual duplication code. Among the known self-checking adder designs, the dual duplicated scheme has the advantage to be totally self-checking for single faults. The drawback of this scheme is that it requires generally the maximum hardware overhead. In this work, we propose a low cost self-checking implementation. The proposed design is a novel differential XOR gate implemented in CMOS pass transistor logic, and performed with only four transistors.
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JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
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in: SICRIS
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