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  • Particle identification via...
    Alderighi, M.; Amorini, F.; Anzalone, A.; Arena, N.; Auditore, L.; Bassini, R.; Boiano, C.; Cardella, G.; Cavallaro, S.; Chatterjee, M.B.; D'Andrea, M.; De Filippo, E.; Fichera, F.; Geraci, E.; Giustolisi, F.; Guardone, N.; Grimaldi, A.; Guazzoni, P.; La Guidara, E.; Lanzano, G.; Lanzalone, G.; Maiolino, C.; Nicotra, D.; Pagano, A.; Papa, M.; Pirrone, S.; Politi, G.; Porto, F.; Pullia, A.; Rizzo, F.; Russo, S.; Russotto, P.; Santonocito, D.; Sacca, G.; Sassi, M.; Schroder, W.U.; Sechi, G.R.; Trifiro, A.; Toke, J.; Trimarchi, M.; Urso, S.; Zetta, L.

    IEEE transactions on nuclear science, 10/2005, Letnik: 52, Številka: 5
    Journal Article

    Mass and atomic-number identification (ID) of reaction products is a fundamental requirement of any nuclear reaction study. An effective particle-ID method is demonstrated, based on pulse shape analysis/discrimination (PSD) applied to large-area, single-element silicon detectors. This technique uses commercial electronic modules and achieves atomic number resolution rivaling that typically obtained with multi-element (/spl Delta/E-E) detector telescopes. The method is applied to the CHIMERA detector system without compromising its time-of-flight (TOF) resolution. In-beam tests of the PSD method have been performed with large-area, 300-/spl mu/m thick CHIMERA silicon detectors, measuring particles from the /sup 19/F+/sup 12/C reaction at Tandem energies. Performance of a simple PSD set up is discussed, for front and rear particle injection.