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Thompson, M C; Badakov, H; Cook, A M; Rosenzweig, J B; Tikhoplav, R; Travish, G; Blumenfeld, I; Hogan, M J; Ischebeck, R; Kirby, N; Siemann, R; Walz, D; Muggli, P; Scott, A; Yoder, R B
Physical review letters, 05/2008, Letnik: 100, Številka: 21Journal Article
First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330 fs), 28.5 GeV electron bunches have been made. Fused silica tubes of 100 microm inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27 GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8+/-0.7 GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques.
