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  • Measurements with a CMOS pi...
    de Boer, W; Bartsch, V; Bol, J; Dierlamm, A; Grigoriev, E; Hauler, F; Herz, O; Jungermann, L; Koppenhöfer, M; Sopczak, A; Schneider, Th

    Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 07/2002, Letnik: 487, Številka: 1
    Journal Article

    CMOS technique, which is the standard process used by most of the semiconductor factories worldwide, allows the production of both cheap and highly integrated sensors. The prototypes MIMOSA 1 1 MIMOSA: Minimum Ionizing particle MOS Active pixel sensor. -I and MIMOSA-II were designed by the IReS–LEPSI collaboration in order to investigate the potential of this new technique for charged particle tracking (Design and Testing of Monolithic Active Pixel Sensors for Charged Particle Tracking, LEPSI, IN2P3, Strasbourg, France). For this purpose it is necessary to study the effects of magnetic fields as they appear in high-energy physics on these sensors.