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Sipila, M.; Lehtinen, K.; Porra, V.
IEEE transactions on microwave theory and techniques, 10/1988, Letnik: 36, Številka: 10Journal Article
A system is presented for the accurate measurement of high-frequency periodic time-domain voltage and current waveforms of a nonlinear microwave device. The measurements are performed in the time domain using a high-speed sampling oscilloscope. The results are Fourier-transformed into the frequency domain for error correction and then back into the time domain. An error-correction algorithm is presented that makes it possible to obtain accurate waveforms in spite of nonideal system components. Practical difficulties in measurement-system characterization are also discussed. An accurate circuit model for the measurement fixture is developed and its element values are determined. Measurement results are given showing the waveforms in a microwave transistor operated in the nonlinear region. The errors caused by signal processing are discussed.< >
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JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
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