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Trojek, T.; Musílek, L.; Čechák, T.
Radiation physics and chemistry (Oxford, England : 1993), February 2014, 2014-2-00, 20140201, Letnik: 95Journal Article
X-ray florescence analysis is an excellent non-destructive tool for analysing the elemental composition of materials in a wide range of works of art. The Department of Dosimetry and Application of Ionising Radiation at CTU-FNSPE has used radionuclide or X-ray tube excited energy dispersive X-ray fluorescence for many kinds of artefacts, including frescos, paintings, manuscripts, metal sculptures and other objects, ceramics, jewellery, various archaeological finds, etc. The method used is more or less “traditional”, i.e., semiconductor spectrometry of excited X-rays, with some optional choices—capillary optics for collimation of exciting beams and two-dimensional scanning. The “hardware” complex is supplemented by techniques for estimating the depth distribution of measured elements, for suppressing surface effects, for in situ non-contact measurements, etc. Extending the measurable range to lighter elements and decreasing the detection limits is one of the achievements that has been attained by improving the instrumentation and techniques that are used. This paper gives a brief review of works carried out at the Department of Dosimetry and Application of Ionising Radiation at CTU-FNSPE. ► X-ray fluorescence analysis as a non-destructive tool for investigating various artefacts. ► Improving instrumentation and experimental techniques for analysis. ► Extending the measurable range to lighter elements and decreasing the detection limits.
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Dostop do baze podatkov JCR je dovoljen samo uporabnikom iz Slovenije. Vaš trenutni IP-naslov ni na seznamu dovoljenih za dostop, zato je potrebna avtentikacija z ustreznim računom AAI.
Leto | Faktor vpliva | Izdaja | Kategorija | Razvrstitev | ||||
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JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
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Povezave do osebnih bibliografij avtorjev | Povezave do podatkov o raziskovalcih v sistemu SICRIS |
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Vir: Osebne bibliografije
in: SICRIS
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