E-viri
Recenzirano
Odprti dostop
-
Aliasghari, S.; Skeldon, P.; Zhou, X.; Gholinia, A.; Zhang, X.; Valizadeh, R.; Pira, C.; Junginger, T.; Burt, G.; Withers, P.J.
Materials chemistry and physics, 11/2021, Letnik: 273Journal Article
A combination of X-ray computed tomography (CT) and focused ion beam - scanning electron microscopy (FIB-SEM) has been employed to investigate substrate and related surface defects in a niobium coated superconducting radio frequency (SRF) copper cavity. The cavity was manufactured by spinning, with subsequent application of a sputtering-deposited niobium coating (≈40 μm thick) on the internal surface. Before coating, the copper surface was pre-treated in several stages, ending with chemical polishing. CT and FIB-SEM identified furrow defects (≈20 μm deep) in the copper beneath the coating, which originated from the spinning process. The furrows were filled with niobium and contained voids at the Nb/Cu interface that extended a few microns into the niobium coating. The presence of the defects led to similar furrows at the niobium surface. The study revealed the importance of pre-treatment of the cavity internal surface and control of the spinning process to avoid defects that may have deleterious influence on the Q slope and durability of the niobium coating. •Nb-coated Cu SRF cavity examined by combination of X-ray-CT and FIB-SEM.•Furrow and void defects identified at Nb/Cu interface.•Defects at Nb/Cu interface correlated with defects at Nb surface.•Defects in Cu substrate originate from the spinning process of cavity manufacture.
Avtor
![loading ... loading ...](themes/default/img/ajax-loading.gif)
Vnos na polico
Trajna povezava
- URL:
Faktor vpliva
Dostop do baze podatkov JCR je dovoljen samo uporabnikom iz Slovenije. Vaš trenutni IP-naslov ni na seznamu dovoljenih za dostop, zato je potrebna avtentikacija z ustreznim računom AAI.
Leto | Faktor vpliva | Izdaja | Kategorija | Razvrstitev | ||||
---|---|---|---|---|---|---|---|---|
JCR | SNIP | JCR | SNIP | JCR | SNIP | JCR | SNIP |
Baze podatkov, v katerih je revija indeksirana
Ime baze podatkov | Področje | Leto |
---|
Povezave do osebnih bibliografij avtorjev | Povezave do podatkov o raziskovalcih v sistemu SICRIS |
---|
Vir: Osebne bibliografije
in: SICRIS
To gradivo vam je dostopno v celotnem besedilu. Če kljub temu želite naročiti gradivo, kliknite gumb Nadaljuj.