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A Comparative study of Ni/Si interaction by means of XRD, RBS, AES and electrical resistivity
Cvelbar, Andrej ...
Tri različne vrste napršenih tankoplastnih struktur Ni/Si smo izpostavili povišani temperaturi in istočasno merili njihovo električno upornost. Po termični obdelavi smo vzorce preiskali z XRD, RBS in ...AES ter rezultate med seboj primerjali in obrazložili.
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