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  • In-situ electrical resistivity measurement based study of interactions in Ni/Al thin films
    Cvelbar, Andrej ...
    Source: Proceedings (1995, str. 347-353)
    Type of material - conference contribution
    Publish date - 1995
    Language - english
    COBISS.SI-ID - 10653735

source: Proceedings (1995, str. 347-353)
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