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  • Criticality of depth of intensity modulation and simulation of refractive index profile in thermal lens technique
    Raj, Vimal ; Swapna, Mohanachandran Nair Sindhu ; Sankararaman, Sankaranarayana Iyer
    Source: EPJ. Applied physics. - ISSN 1286-0042 (Vol. 90, no. 1, 2020, str. 1-7)
    Type of material - article, component part
    Publish date - 2020
    Language - english
    COBISS.SI-ID - 113924611

source: EPJ. Applied physics. - ISSN 1286-0042 (Vol. 90, no. 1, 2020, str. 1-7)
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