Method and device for the determination of a measure of band gaps at optoelectronic components; Verfahren und eine Vorrichtung zur Bestimmung einer Messung von Bandlücken bei optoelektronischen Komponenten; Procédé et dispositif pour la détermination d'une mesure de bandes interdites au niveau de composants optoélectroniques : European patent specification EP 3 394 979 B1, 2019-09-18; Verfahren und eine Vorrichtung zur Bestimmung einer Messung von Bandlücken bei optoelektronischen Komponenten; Procédé et dispositif pour la détermination d'une mesure de bandes interdites au niveau de composants optoélectroniques

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Method and device for the determination of a measure of band gaps at optoelectronic components = Verfahren und eine Vorrichtung zur Bestimmung einer Messung von Bandlücken bei optoelektronischen Komponenten = Procédé et dispositif pour la détermination d'une mesure de bandes interdites au niveau de composants optoélectroniques : European patent specification EP 3 394 979 B1, 2019-09-18

Bokalič, Matevž ...

Type of material - patent

Publication and manufacture - Munich : European Patent Office, 2019

Language - english

COBISS.SI-ID - 12725844

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Author
Bokalič, Matevž | Topič, Marko | Pieters, Bart Elger | Gerber, Andreas | Rau, Uwe

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Bokalič, Matevž	30685
Topič, Marko	12609
Pieters, Bart Elger
Gerber, Andreas
Rau, Uwe

Source: Personal bibliographies and: SICRIS

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