ALL libraries (COBIB.SI union bibliographic/catalogue database)
  • Characterization of thin films and surfaces by ion-beam analytical techniques
    Pelicon, Primož ...
    Source: Proceedings (str. 595-602)
    Type of material - conference contribution
    Publish date - 1999
    Language - english
    COBISS.SI-ID - 14617127

source: Proceedings (str. 595-602)
loading ...
loading ...
loading ...