Sample characterization by transverse photothermal beam deflection spectrometry in skimming configuration

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Sample characterization by transverse photothermal beam deflection spectrometry in skimming configuration

Budasheva, Hanna ...

Source: Journal of applied physics. - ISSN 0021-8979 (Vol. 133, issue 21, [article no.] 211101, Jun. 2023, str. 1-24)

Type of material - article, component part

Publish date - 2023

Language - english

COBISS.SI-ID - 155461891

Link(s):
https://pubs.aip.org/aip/jap/article-abstract/133/21/211101/2893856/Sample-characterization-by-transverse-photothermal?redirectedFrom=fulltext
Repository of University of Nova Gorica - RUNG
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Author
Budasheva, Hanna | Swapna, Mohanachandran Nair Sindhu | Sankararaman, Sankaranarayana Iyer | Korte, Dorota

Topics
photothermal techniques | beam deflection spectrometry | material characterization

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source: Journal of applied physics. - ISSN 0021-8979 (Vol. 133, issue 21, [article no.] 211101, Jun. 2023, str. 1-24)

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Budasheva, Hanna	50903
Swapna, Mohanachandran Nair Sindhu	56648
Sankararaman, Sankaranarayana Iyer
Korte, Dorota	31463

Source: Personal bibliographies and: SICRIS

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