Elements of electromigration : electromigration in 3D IC technology

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Elements of electromigration : electromigration in 3D IC technology

Tu, King-Ning ; Liu, Yingxia

Type of material - book ; adult, serious

Edition - 1st ed.

Publication and manufacture - Boca Raton ; London ; New York : CRC Press, Taylor & Francis, 2024

Language - english

ISBN - 978-1-03-247027-6

COBISS.SI-ID - 190678019

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Library/institution	City	Acronym	For loan	Other holdings
Central Technological Library of the University of Ljubljana	Ljubljana	CTK	outside loan 1 cop.

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Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Tu, King-Ning
Liu, Yingxia

Source: Personal bibliographies and: SICRIS

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