Analysis of thin-film detector structures of amorphous silicon for detection of ultraviolet radiation; Analiza tankoplastnih detektorskih struktur iz amorfnega silicija za detekcijo ultravijoličnega sevanja

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Analysis of thin-film detector structures of amorphous silicon for detection of ultraviolet radiation = Analiza tankoplastnih detektorskih struktur iz amorfnega silicija za detekcijo ultravijoličnega sevanja

Jankovec, Marko

Type of material - book ; adult, serious

Edition - 1. izd.

Publication and manufacture - Ljubljana : Fakulteta za elektrotehniko, 2005

Language - slovenian

ISBN - 961-243-004-7

COBISS.SI-ID - 219604992

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Selected topics of semiconductor electronics

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Library/institution	City	Acronym	For loan	Other holdings
National and University Library, Ljubljana	Ljubljana	NUK	reading room 1 cop.

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Year	Impact factor		Edition		Category		Classification
Year	JCR	SNIP	JCR	SNIP	JCR	SNIP	JCR	SNIP

Links to authors' personal bibliographies	Links to information on researchers in the SICRIS system
Jankovec, Marko	20184

Source: Personal bibliographies and: SICRIS

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