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  • Application of X-ray photoelectron spectroscopy (XPS) as powerful tool for characterization of plasma treated surfaces and thin organic coatings
    Kovač, Janez, 1965-
    Source: Conference proceedings (Str. 51-55)
    Type of material - conference contribution
    Publish date - 2009
    Language - english
    COBISS.SI-ID - 22986279